Creating Tests to generate Dynamic Failure Effects
Feature Description
Step 1 - Creating IO Flag tests
1] Create New "Test Set"Creating New Test Set and mark folder "Non-Diagnostic" in Context "Details" panel Selecting Test Set Usage. These tests will not be used as part of the diagnostics study but are generated to develop Failure Effects. These Non-Diagnostic tests have no category. The diagnostic tests will be categorized as to usage type (CBIT, IBIT, PBIT, POST, ACCEPTANCE).
2] With test Set "selected" select all "IO Flags" except Software or Firmware Flags
3] Create "Probe Tests" on "IO Flags" and use "Failure of" in Name as shown at right
1] With test Set open select all "Software of Firmware Bidirectional Ports"
2] Create "Probe Tests in the same manner as above except window will open asking if test are wanted for each output function as shown at right
3] Select "Yes"
4] A new window will open to select Stimuli For Test Generation (Not 'Shown). Select "OK"
5] Software/Firmware tests will appear in Test Set
Step 3 - Combining differential Tests into Group tests to reduce Effect Entries
1] Create Group Tests for IO's that work together (example J3::+3VDC and J3::GND) as shown at right See How to Make Group Tests
Step 4 - Converting Funtional base path tests to Failure mode Tests
1] Select the failure mode path based test set and use the method shown at the right to convert the coverage of the tests in the test set to "Use Failure Based Coverage and Interference" as shown at the right.
