Common Cause: Half-Split Failure Probs. (Max. Depth = 10)
What is the purpose of this algorithm?
The fault isolation algorithm Common Cause: Half-Split Failure Probs. (Max. Depth = 10) is the same as the algorithm Common Cause: Half-Split Failure Probs. with the added constraint that no more than 10 tests can be used in each isolation path. This constraint is implemented as an additional cutoff which prevents isolation from continuing after 10 isolation tests have been performed. The weightings for this algorithm favor tests that come close to half-splitting the suspect set when they pass.
How was this algorithm implemented?
The full set of test selection criteria for this algorithm are as follows:
1. Test Candidate Grouping 1 of 2: Test Set Isolation
a) Candidate Test Types (1)
b) Weightings: uses algorithm defaults
c) Cutoffs: uses algorithm defaults
2. Test Candidate Grouping 2 of 2: Internal Isolation
a) Candidate Test Types (2)
b) Weightings: uses algorithm defaults
c) Cutoffs: uses algorithm defaults
1. Test Weighting 1 of 3: Sum Failure Probability
a) Priority: 50
b) Entity: Failure Probability
c) Type: Sum
d) Domain: Suspect Functions Proven
e) Best Equals: Half-Split
2. Test Weighting 2 of 3: Sum Failure Probability
a) Priority: 40
b) Entity: Failure Probability
c) Type: Sum
d) Domain: Suspect Failure Modes Proven
e) Best Equals: Half-Split
3. Test Weighting 3 of 3: Count Number of Items
a) Priority: 20
b) Entity: Number of Items
c) Type: Count
d) Domain: Suspect Functions Proven
e) Best Equals: Half-Split
C. Default Test Cutoffs (2)
1. Cutoff 1 of 2: Count Number of Items
a) Entity: Number of Items
b) Type: Count
c) Domain: Suspected Items
d) Modifier: <none>
e) Target: <none>
f) Condition: <= 1
g) Action: Terminate Sequence
2. Cutoff 2 of 2: Count Number of Tests
a) Entity: Number of Tests
b) Type: Count
c) Domain: Isolation Path
d) Modifier: <none>
e) Target: <none>
f) Condition: >= 10
g) Action: Ignore in Sequence
