To properly display this page you need a browser with JavaScript support.
eXpress
Help
×
Menu
Index
Search
Search
Search
Glossary & Standards
Standards, Handbooks and Publications
IEEE 1522
Previous page
Next page
To properly display this page you need a browser with JavaScript support.
IEEE 1522
The IEEE
Standard for Testability and Diagnosability Characteristics and Metrics
defines many metrics that are supplied (under different names) within
eXpress
. The following table lists the applicable metrics in this document and their equivalents.
Testability Metric
eXpress
Equivalent
eXpress
Report
Percentage of Detection
Total Functions Detected
Detection Order Report
Expected Percentage of Detection
Total Probability Detected
Detection Order Report
Incremental Percentage of Isolation
Pctg. (%)
column in
Isolation Percentages Using Testing Only
Fault Isolation Report
Cumulative Percentage of Isolation
Cumulative Pctg. (Cum %)
column in
Isolation Percentages Using Testing Only
Fault Isolation Report
Incremental Expected Percentage of Isolation
Pctg. (%)
column in
Isolation Probabilities Using Testing Only
Fault Isolation Report
Cumulative Expected Percentage of Isolation
Cumulative Pctg. (Cum %)
column in
Isolation Probabilities Using Testing Only
Fault Isolation Report
Expected
Ambiguity
Group Size
Expected Fault Group Size
Fault Isolation Report
Isolation Effectiveness
Isolation Effectiveness
Fault Isolation Report
Projected Effect of
Ambiguity
upon False Removals
1.0 -
Isolation Effectiveness
Fault Isolation Report