In previous versions of eXpress, probe tests could be created either for selected nets or selected output flags. Probe tests can also be created for selected ports, with the option to create a separate test for each output function on a given port.
When the “Create Probe Test(s)” operation is invoked for selected ports, the options dialog will appear no differently than usual. Simply enter a test name and click on the “Create” button.
If multiple output functions have been defined on one or more of the selected ports, then the prompt displayed below will appear, asking if you wish to create tests per output function.
Select “Yes” to create a separate test for each output function on the selected port(s). Select “No” to create only one test per port.
The tests in the test set displayed at right were created by selecting the same port for which we batch-created output functions in the previous example. One test was created for each output function on the port.
Notice that the output function name was appended (in curly braces) to the name of each test that was created.
In conjunction with the ability to batch-create output functions for selected inputs, this feature allows you to quickly create tests for a large number of test functions. This can save you a lot of time when modeling large FPGAs or other programmable components.
